RLT5

Module assembled by the UK Barrel Cluster
using UK/Oslo thin film hybrid

 * Components * Conditions * Trimming * Noise Occupancy and Stability *
* Response Curve * Table of Results *

Components

Chips

Wafer
Batch
X
Y
xeff
nDead
Non Trim
Gain
Offset
Qfactor
Use
5
30423
2
15
0
0
1
65.7
-15.3
7.73
RLT5-M0
5
30423
2
16
1
1
3
63.7
-18.5
5.59
RLT5-S1
5
30423
3
1
0
0
0
60.5
-10.4
6.89
RLT5-S2
5
30423
3
5
1
1
1
59.3
-7.0
6.10
RLT5-S3
5
30423
3
6
0
0
0
60.9
-9.2
5.23
RLT5-S4
5
30423
3
7
0
0
3
57.4
-1.7
6.26
RLT5-E5
5
30423
3
9
0
0
1
60.8
-14.3
3.30
RLT5-M8
5
30423
3
10
0
0
3
60.1
-4.2
2.24
RLT5-S9
5
30423
3
11
1
1
2
62.9
0.4
2.13
RLT5-S10
3
30423
6
12
0
0
20
63.0
-9.2
4.81
RLT5-S11
3
30423
6
11
0
0
28
62.5
-18.2
5.53
RLT5-S12
3
30423
7
8
0
0
34
58.8
-6.3
5.81
RLT5-E13
Hence a total of 96 untrimmable channels were predicted.

Hybrid

Aluminium/Polyimide Thin Film with extra copper ground plane, connected substrate and wirebonded interconnects.

Detectors


Operating Conditions

Vcc   3.5V (on support card)
Vdd   4.0V (on support card)
Vdet   100V (1300nA at 38C)

Bias Current  267 microA
Shaper Current  30 microA
Compression mode 1 (CENTRAL BIN, X1X)
Edge Detect  0 (OFF)

The module is mounted inside a QMW module box.  The box is connected to analogue ground at the patch card by means of a wire; the box is fitted with plastic covers.  No conductive rubber sheeting is placed inside the module box to ensure thermal contact between the cooled facing and the aluminum support: direct contact was found to be sufficient.  Basic cooling of the box is provided by means of a heatsink upon which it is placed (a large granite block) and a simple fan.


Trimming

Module trimmed such that 11.9 mV VCAL (guesstimate 1fC) = 120 mV
This gives a total of 76 untrimmable channels.
  • TrimDAC response link0
  • TrimDAC response link1

  • Noise Occupancy and Stability

    Noise Occupancy Scanning Up (1027-1)
  • Summed Noise Occupancy (log scale)
  • Summed Noise Occupancy (linear scale)
  • Noise Occupancy Scanning Down (1027-2)
  • Summed Noise Occupancy (log scale)
  • Summed Noise Occupancy (linear scale)
  • Individual S curves link 0
  • Individual S curves link 1
  •  

    Response Curve

  • Response Curve link0
  • Response Curve link1

  • Table of Results

     
     
    Chip
    0
    Chip
    1
    Chip
    2
    Chip
    3
    Chip
    4
    Chip
    5
    Chip
    6
    Chip
    7
    Chip
    8
    Chip
    9
    Chip
    10
    Chip
    11
    Link
    0
    Link
    1
    Overall
    Gain
    62
    60
    59
    57
     59
    56
    57
    56
    58
    56
    56
    53
     59
     56
     57.5
    mV/fC
    Noise(mV)
    15
    14
    14
    14
    14
    13
    13
    13
    13
    16
    16
    13
     14
     14
     14
    mV
    Noise(fC)
    0.24
    0.23
    0.24
    0.25
    0.24
    0.23
    0.23
    0.23
    0.22
    0.29
    0.29
    0.25
     0.24
     0.25
     0.245
    fC
    Noise(ENC)
     1500
    1440
    1500
    1560
    1500
    1440
    1440
    1440
    1380
    1810
    1810
    1560
     1490
     1570
     1560
    ENC
    Stability Point
    90
    90
    90
    90
    90
    90
    90
    90
    90
    90
    90
    90
    90
    90
    90
    mV
    Offset (mV) (by Noise Occupancy Method)
    63
    68
    76
    76
    76
    77
    77
    72
    63
    76
    81
    79
    73
    75
    74
    mV
    Stability - Offset (mV)
    27
    22
    14
    14
    14
    13
    13
    18
    27
    14
    9
    11
    17
    15
    16
    mV
    Stability - Offset (fC)
    0.44
    0.37
    0.24
    0.25
    0.24
    0.23
    0.23
    0.32
    0.47
     0.25
     0.30
    0.21 
     0.29
     0.27
     0.28
    fC
    n Masked Channels
     0
    3
    0
    1
    0
    4
    2
    3
    2
    11
    17
    28
    8
    63
    71
    -

    Footnote

    The results given here refer to lab measurements made before the recent 40MHz testbeam run.  The module was retrimmed and recalibrated in situ at the beamtest, hence the calibration and operating conditions may differ in detail with respect to the testbeam results.


    Modified 26.05.00
    Comments / questions / suggestions: please contact Peter W Phillips